KEYWORDS: Luminescence, Near field scanning optical microscopy, Silicon, Optical microcavities, Spectroscopy, Near field, Photonic crystals, Near field optics, Silicon photonics, Argon ion lasers
Photoluminescence spectroscopy of porous silicon photonic crystal microcavities is studied by the far-field and near-field robes using the apertureless scanning near-field optical microscope. Narrow microcavity mode with the spectral width of 10nm in far-field spectra and broad photoluminescence peak with the spectral width of 50nm in near-field spectra of microcavity samples is observed. It has been studied some correlations between near-and far-field spectra of porous silicon structures.
KEYWORDS: Luminescence, Near field optics, Near field scanning optical microscopy, Near field, Photonic crystals, Silicon, Optical microcavities, Spectroscopy, Scattering, Optical fibers
The spatial distribution of the local optical field in the photonic crystal (PC) microcavities (MC) formed from porous silicon and in MC doped by fluorescent dye is studied by apertureless scanning near-field optical microscope (SNOM). To increase fluorescence up to 100 times photonic crystals are doped by fluorescence dye Rhodamin 6G. Photoluminescence spectroscopy of porous silicon photonic crystal MC is studied by far-field and near-field probes. The spatial distribution of optical field at the cleaved edge of MC is observed in
near-field scattering and photoluminescence. The image of the spatial distribution of local optical field in near-field fluorescence at the wavelength of local optical maximum of fluorescence spectra shows the localization of radiation in MC layer.
The spatial distribution of the local optical field at the cleavage of photonic crystal smicrocavity has been obtained by the scanning near-field optical microscope (SNOM). The localization of optical radiation at microcavity resonant wavelength in the vicinity of the λ/2 spacer layer is demonstrated. Samples of photonic crystal microcavity are prepared from silicon wafer by electrochemical etching technique. The wavelength of the microcavity mode is optimized for resonance with wavelengths of lasers. The image of the spatial distribution of optical field at the cleaved edge of the facing vertically microcavity is observed. Sample is pumped through external single-mode fiber perpendicularly to the microcavity. SNOM
operates in the collection mode with the apertureless tip. We observe the localization of the resonant optical field in microcavity but we do not reveal such localization of the radiation at the non-resonant wavelength.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.