Mr. James Patrick Flint Profile

James Patrick Flint

Vice President of Technology and Business Dev at Galaxy Compound Semiconductors Inc

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Author

Publications (18)

Proceedings Article | 18 June 2018 Presentation + Paper

Bulk characterization and surface analysis of epitaxy ready cadmium zinc telluride substrates for use in IRFPA manufacturing for IR imaging

J. Flint, M. Cooper, J. Mackenzie, F. Kumar

Proceedings Volume 10624, 106240X (2018) https://doi.org/10.1117/12.2305732

KEYWORDS: Polishing, Surface finishing, Zinc, Crystals, Manufacturing, Cadmium, Epitaxy, Tellurium, Infrared detectors, Infrared radiation

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Proceedings Article | 21 June 2017 Presentation

Production manufacturing of 5" diameter gallium antimonide substrates (Conference Presentation)

Patrick Flint, Gordon Dallas, Annette Bollaert

Proceedings Volume 10177, 101770P (2017) https://doi.org/10.1117/12.2266271

KEYWORDS: Galactic astronomy, Compound semiconductors, Infrared technology, Current controlled current source, Manufacturing, Gallium antimonide

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Proceedings Article | 16 May 2017 Paper

Standardizing large format 5" GaSb and InSb substrate production

Becky Martinez, J. Patrick Flint, G. Dallas, B. Smith, M. Tybjerg, Shanmugam Aravazhi, Mark Furlong

Proceedings Volume 10177, 101772L (2017) https://doi.org/10.1117/12.2263961

KEYWORDS: Gallium antimonide, Crystals, Epitaxy, Compound semiconductors, Process control, Gallium arsenide, Semiconducting wafers, Yield improvement, Indium, Polishing, Statistical analysis

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Proceedings Article | 16 May 2017 Presentation + Paper

Bulk growth and surface characterization of epitaxy ready cadmium zinc telluride substrates for use in IR imaging applications

J. Flint, B. Martinez, T. E. Betz, J. Mackenzie, F. Kumar, L. Burgess

Proceedings Volume 10177, 1017717 (2017) https://doi.org/10.1117/12.2263960

KEYWORDS: Infrared detectors, Cadmium, Zinc, Polishing, Surface finishing, Epitaxy, Compound semiconductors, Crystals, Manufacturing, Infrared materials, Semiconducting wafers, Oxides, Tellurium

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Proceedings Article | 20 May 2016 Paper

Bulk growth and surface characterization of epitaxy ready cadmium zinc telluride substrates for use in IR imaging applications

J. Flint, B. Martinez, T. E. Betz, J. MacKenzie, F. Kumar, G. Bindley

Proceedings Volume 9819, 981913 (2016) https://doi.org/10.1117/12.2225796

KEYWORDS: Cadmium, Zinc, Infrared imaging, Surface finishing, Crystals, Surface finishing, Polishing, Oxides, Tellurium, Infrared detectors, X-rays

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Proceedings Article | 20 May 2016 Paper

A study of the preparation of epitaxy-ready polished surfaces of (100) Gallium Antimonide substrates demonstrating ultra-low surface defects for MBE growth

Rebecca Martinez, Marius Tybjerg, Patrick Flint, Joel Fastenau, Dmitri Lubyshev, Amy Liu, Mark Furlong

Proceedings Volume 9819, 981916 (2016) https://doi.org/10.1117/12.2225993

KEYWORDS: Gallium antimonide, Surface finishing, Polishing, Semiconducting wafers, Chemical mechanical planarization, Crystals, Oxides, Air contamination, Etching, Chemistry

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Proceedings Article | 24 June 2014 Paper

Growth and characterization of 6" InSb substrates for use in large-area infrared-imaging applications

Mark Furlong, Gordon Dallas, Greg Meshew, J. Patrick Flint, David Small, Becky Martinez, Andrew Mowbray

Proceedings Volume 9070, 907016 (2014) https://doi.org/10.1117/12.2053969

KEYWORDS: Crystals, Infrared radiation, Infrared imaging, Infrared technology, Current controlled current source, Phase modulation, Laser phosphor displays, Gallium nitride, Indium, Mid-IR

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Proceedings Article | 31 January 2014 Paper

Growth and characterization of 6" InSb substrates for use in large area infrared imaging applications

Mark Furlong, Gordon Dallas, Greg Meshew, J. Patrick Flint, David Small, Becky Martinez, Andrew Mowbray

Proceedings Volume 8993, 89931J (2014) https://doi.org/10.1117/12.2042393

KEYWORDS: Crystals, Semiconducting wafers, Surface finishing, Polishing, Staring arrays, Surface roughness, Oxides, Infrared imaging, Sensors, Compound semiconductors

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Proceedings Article | 4 February 2013 Paper

Towards the production of very low defect GaSb and InSb substrates: bulk crystal growth, defect analysis and scaling challenges

R. Martinez, S. Amirhaghi, B. Smith, A. Mowbray, Mark Furlong, J. Flint, G. Dallas, G. Meshew, J. Trevethan

Proceedings Volume 8631, 86311N (2013) https://doi.org/10.1117/12.2005130

KEYWORDS: Crystals, Gallium antimonide, Semiconducting wafers, Etching, Sensors, Staring arrays, Manufacturing, Compound semiconductors, Wafer-level optics, X-ray diffraction

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Proceedings Article | 31 May 2012 Paper

100mm GaSb substrate manufacturing for IRFPA epi growth

Lisa Allen, J. Patrick Flint, Greg Meshew, Gordon Dallas, John Trevethan, Dmitri Lubyshev, Yueming Qiu, Joel Fastenau, Amy W. Liu

Proceedings Volume 8353, 835313 (2012) https://doi.org/10.1117/12.919287

KEYWORDS: Gallium antimonide, Semiconducting wafers, Manufacturing, Surface roughness, Crystals, Surface finishing, Sensors, Staring arrays, Oxides, Atomic force microscopy

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Proceedings Article | 21 January 2012 Paper

Surface chemistry improvement of 100mm GaSb for advanced space based applications

L. Allen, J. P. Flint, G. Meshew, J. Trevethan, M. Furlong, B. Martinez, A. Mobray

Proceedings Volume 8268, 826819 (2012) https://doi.org/10.1117/12.904778

KEYWORDS: Digital signal processing, Gallium antimonide, Surface finishing, Oxides, Semiconducting wafers, Antimony, Polishing, Gallium, Chemical mechanical planarization, Laser sintering

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Proceedings Article | 21 January 2012 Paper

Manufacturing of 100mm diameter GaSb substrates for advanced space based applications

L. Allen, J. P. Flint, G. Meshew, J. Trevethan, G. Dallas, A. Khoshakhlagh, C. Hill

Proceedings Volume 8268, 826817 (2012) https://doi.org/10.1117/12.904777

KEYWORDS: Gallium antimonide, Semiconducting wafers, Surface finishing, Laser sintering, Oxides, Manufacturing, Particles, Air contamination, Polishing, Surface roughness

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Proceedings Article | 21 May 2011 Paper

100mm diameter GaSb substrates with extended IR wavelength for advanced space-based applications

L. Allen, J. Flint, G. Meschew, G. Dallas, D. Bakken, G. Brown, A. Khoshakhlagh, C. Hill

Proceedings Volume 8012, 801215 (2011) https://doi.org/10.1117/12.882937

KEYWORDS: Gallium antimonide, Surface finishing, Polishing, Oxides, Semiconducting wafers, Laser sintering, Surface roughness, Infrared detectors, Atomic force microscopy, Chemical analysis

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Proceedings Article | 25 September 2009 Paper

CMP process comparison for 150mm larger area InSb (111)B focal plane array substrates

P. Flint, L. Allen, G. Dallas, B. Ruchert, D. Bakken, K. Blanchat, S. Vangala, W. Goodhue, D. Bliss, H. Dauplais

Proceedings Volume 7487, 74870C (2009) https://doi.org/10.1117/12.830114

KEYWORDS: Chemical mechanical planarization, Oxides, Crystals, Surface finishing, Antimony, Atomic force microscopy, Homoepitaxy, Radium, Polishing, Surface roughness

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Proceedings Article | 7 May 2009 Paper

GaSb substrates with extended IR wavelength for advanced space-based applications

L. Allen, P. Flint, G. Dallas, D. Bakken, K. Blanchat, G. Brown, S. Vangala, W. Goodhue, K. Krishnaswami

Proceedings Volume 7298, 72983P (2009) https://doi.org/10.1117/12.817858

KEYWORDS: Gallium antimonide, FT-IR spectroscopy, Oxides, Homoepitaxy, Chemical mechanical planarization, Sensors, Atomic force microscopy, Antimony, Semiconducting wafers, Infrared detectors

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Proceedings Article | 21 November 2000 Paper

Electrical compensation in CdTe and CdZnTe by intrisic defects

Nemanja Krsmanovic, Kelvin Lynn, Marc Weber, Russell Tjossem, Salah Awadalla, Csaba Szeles, Patrick Flint, Howard Glass

Proceedings Volume 4141, (2000) https://doi.org/10.1117/12.407584

KEYWORDS: Cadmium, Tellurium, Crystals, Neodymium, Sensors, Thermoelectric materials, Aluminum, Information operations, Ionization, Sodium

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Proceedings Article | 21 November 2000 Paper

Thermal treatments of CdTe and CdZnTe detectors

Kaushik Chattopadhyay, X. Ma, Jean-Olivier Ndap, Arnold Burger, Tuviah Schlesinger, Corin Greaves, Howard Glass, J. Flint, Ralph James

Proceedings Volume 4141, (2000) https://doi.org/10.1117/12.407595

KEYWORDS: Sensors, Annealing, Temperature metrology, Sensor performance, Gold, Crystals, Interfaces, Heat treatments, Spectroscopy, Luminescence

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Proceedings Article | 21 November 2000 Paper

Studies of deep trapping levels in undoped and Sn-doped Cd1-xZnxTe by thermoelectric effect spectroscopy and thermally stimulated current

Nemanja Krsmanovic, Alan Hunt, Kelvin Lynn, Patrick Flint, Howard Glass

Proceedings Volume 4141, (2000) https://doi.org/10.1117/12.407577

KEYWORDS: Tin, Cadmium, Sensors, Neodymium, Thermoelectric materials, Spectroscopy, Ionization, Tellurium, Sensor performance, Data modeling

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Showing 5 of 18 publications

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