This paper introduces an automatic system for maintaining the zero interference band in interferometric measurements. It facilitates precise measurements of maximum (Imax) and minimum (Imin) intensities across the investigated area for interference pattern visibility. The system employs a piezoceramic modulator for interference fringe generation, synchronized detectors for simultaneous Imax and Imin registration, and automatic phase control to ensure phase coherency. This system enhances measurement accuracy and efficiency, finding applications in interferometric experiments involving phase-inhomogeneous objects and dispersive media.
Paper, matte and glossy materials (packaging materials) are one of the most common printing materials, particularly among those used in packaging. Glossy materials are characterized by height inhomogeneity of about 0.6 μm, which is comparable with the wavelength of the He-Ne laser that forms the speckle field. Obtaining amplitude-phase information for research of structurally heterogeneous packaging materials is an urgent task today. This study considers a model for analyzing the behavior of fluorescent carbon particles in a speckle field obtained from a glossy material. The application of the Hilbert transformation makes it possible to recover information about the phase distribution of the investigated optical field. To restore the phase information, the localization of carbon nanoparticles at the minimum intensity points with singularities and without singularities was used, with the addition of lost information to restore the phase map using the Hilbert transformation. Determining the location of carbon nanoparticles by fixing their luminescence significantly improves the overall picture of the phase restoration of the investigated object due to the high accuracy of reproducing the information about the localization of points of minimum intensity with singularities.
Method based on polarization-interference for determination the geometric and dynamic phase in a case of linearly birefringent, internally reflective media is proposed. The object is probed by horizontally polarized incident beam, and the resulting interference distribution consist of two components depending on medium orientation. The interference of horizontal components of object and reference field allows one to estimate the sum of dynamic and geometric phases, while the vertical components interference produce the dynamic phase. The proposed method allows one to estimate the geometric phase value in a case of only one input polarization state.
This work is aimed at generalizing the methods of laser polarimetry in the case of partially depolarizing optically anisotropic methyl acrylate layers. A method of differential Mueller-matrix mapping is proposed and substantiated for reproducing the distributions of the parameters of linear and circular birefringence and dichroism of partially depolarizing methyl acrylate layers.
This work is aimed at generalizing the methods of laser polarimetry in the case of partially depolarizing optically anisotropic polymer layers. A method of differential Mueller-matrix mapping was proposed and substantiated for reproducing the distributions of the parameters of linear and circular birefringence and dichroism of methyl acrylate layers under various temperature conditions (200 ‒ group 1) and (450 ‒ group 2).
A method of azimuthally invariant 3d Mueller-matrix mapping of the distributions of the parameters of phase and amplitude anisotropy of partially depolarizing layers of high-quality (group 1 - high density) and low-quality (group 2 - low density) polyethylene polymer films has been proposed and substantiated. layer-by-layer coordinate distributions of the magnitude of the set of Mueller-matrix invariants (MMI) of polymer films of both types were obtained in the volume of polymer samples.
Polymeric materials based on polystyrene (PS) are one of the most common polygraph materials. It is necessary to differentiate between of optical homogeneity of the polycrystalline structure of PS. We aim to demonstrate the use of a polarization interference method to allow quick and easy practical differentiation between PS samples with different types of deformations. Polycrystalline optically homogeneous and mechanically stressed samples of PS were investigated. We map the local contrast of interference patterns in microscopic images of образцов PS using a set-up polarizing interferometer, based on the superposition of a reference laser beam with the interference pattern of the sample in the image plane. The local contrast distributions can be directly related to the polycrystalline structure of образцов PS. The dependences of the magnitude of the 1st to 4th order statistical moments of the local contrast polarization-interference distribution are determined. To determine the diagnostic potential of the method две groups of polycrystalline образцов PS were formed. The first group contained 16 optically homogeneous PS samples, while the second contained 16 PS samples with residual mechanical stresses.
The article presents the results of determining the possibilities of the polarization-singular approach to improve the efficiency of Mueller-matrix polarimetry in the differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers. The relationship between the characteristic values of the elements of the Mueller matrix and polarization-singular L - states of microscopic images of polycrystalline structure of optically transparent polycarbonate layers was determined. A technique for the experimental determination of the distributions of the characteristic values of Mueller-matrix images has been developed and tested. Statistical criteria for express differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers with different mechanical stresses were determined.
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