Mr. Peng Wang Profile

Peng Wang

at Jiangsu Shuguang Opto-Electronics Co., Ltd.

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Publications (2)

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Proceedings Article | 20 June 2024 Presentation + Paper

The designing of a far-field laser facula measurement system based on detector array

Rongguo Fu, Zhongcheng Wang, Zexuan Li, Xiang Yu, Mingzhu Huang, Lingyun Ma, Jianpo Gao, Xing Lv, Huanan Zhang, Peng Wang

Proceedings Volume 12999, 129991Z (2024) https://doi.org/10.1117/12.3016557

KEYWORDS: Detector arrays, Sensors, Target detection, Data transmission, Signal detection, Data acquisition, Design, Signal processing, Laser processing, Digital signal processing

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Measurement of the far-field parameters of lasers after atmospheric transmission plays an important role in accurately evaluating the atmospheric transmission characteristics of lasers and the overall performance of laser systems. The spot size formed by the laser after long-distance transmission can reach the meter scale, which cannot be measured by the traditional camera due to the limitation of field of view and resolution. In this paper, a measurement far-field laser system for large-size far-field lasers is designed by the detector array method. The following parts are mainly studied, first, the design of the acquisition circuit of the detector array, second, the development of FPGA for data acquisition and network data transmission, and third, the development of the host computer software to complete the remote control, receiving data, image restoration and parameter measurement work.

The acquisition circuit is based on InGaAs photodetectors, operational amplifiers and analog-to-digital converters to design hardware circuits; Xilinx's Artix-7 series xc7a50t chip as the core to complete the multi-channel parallel acquisition and network data transmission based on the W5300 network chip; the upper computer software is based on the MFC platform for the development of the software, and the proposed image restoration algorithm based on the predicted gradient. The upper computer software is developed based on MFC platform, and the image recovery algorithm based on predicted gradient is proposed. Experimental tests show that the hardware circuit works stably, the communication reliability is high, and the data acquisition and transmission frequency reach 100Hz according to the design requirements.

Proceedings Article | 30 November 2023 Paper

The research of birefringence of infrared optical crystal ZnS and Si

LingYun Ma, RongGuo Fu, YingJian Bi, ZhiPeng Liu, Lei Wang, WeiPing Liu, JianPo Gao, HuaNan Zhang, Xing Lv, MingZhu Huang, Xiang Yu, Peng Wang

Proceedings Volume 12796, 127960A (2023) https://doi.org/10.1117/12.2690987

KEYWORDS: Crystals, Birefringence, Crystal optics, Polarization, Zinc sulfide, Silicon, Mueller matrices, Photoelastic modulators, Laser crystals

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The mid-infrared birefringence coefficients, including photoelastic coefficients, phase delay, and fast axis angle, are important indicators for evaluating infrared crystal materials. These coefficients can detect deviations introduced during optical glass processing and stress birefringence generated under external forces, which are mostly used to measure the influence of birefringence deviation of optical window under atmospheric pressure before assembly. This paper introduces a dual photoelastic modulators (PEMs) system for detecting birefringence in the near infrared to midinfrared range. The hardware of this system includes a 3390nm laser, a -45°polarizer, a 0°PEM, a +45°PEM, a 90°polarizer, a photodetector, a lock-in amplifier with filter circuit module, and a host computer, which can achieve modulation and demodulation of the polarization state of light and extraction of weak electric signal. The software interface of this system includes, data acquisition card channel setting interface, electrical signal waveform display interface and birefringence coefficient data processing interface. The polarization state analysis method using Stokes parameters and Mueller matrices, along with data processing techniques, enables automated and precise measurement of mid-infrared birefringence coefficients in crystals. Multiple sets of measurement data yield a phase delay of 9.863541 nm for a 15mm thick Si crystal and a phase delay of 8.971042 nm for a 12mm thick ZnS crystal. The repeatability of the measurement device is 0.020, and the measurement uncertainty is 0.019. This system can be extended for precision measurement of stress birefringence in multi-wavelength infrared crystals. It not only fills the gap in testing equipment for mid-infrared crystal photoelastic coefficients but also provides valuable guidance for the design, evaluation, and application of crystal stress birefringence systems.

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