Peter Jan Doets
at Technische Univ Delft
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 February 2006 Paper
P. J. Doets, M. Menor Gisbert, R. Lagendijk
Proceedings Volume 6072, 60720L (2006) https://doi.org/10.1117/12.642968
KEYWORDS: Signal to noise ratio, Algorithm development, Atomic force microscopy, Interference (communication), Distance measurement, Digital watermarking, Systems modeling, Databases, Feature extraction, Signal processing

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