Dr. Peter Markus Seitz Profile

Dr. Peter Markus Seitz

Managing Director at ETH Zurich

SPIE Involvement:

Author

Publications (32)

Proceedings Article | 14 May 2008 Paper

Ultra-miniature catadioptrical system for an omnidirectional camera

C. Gimkiewicz, C. Urban, E. Innerhofer, P. Ferrat, S. Neukom, G. Vanstraelen, P. Seitz

Proceedings Volume 6992, 69920J (2008) https://doi.org/10.1117/12.779988

KEYWORDS: Mirrors, Cameras, Imaging systems, Sensors, Combined lens-mirror systems, Image sensors, Optical design, Panoramic photography, Lens design, Prototyping

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Proceedings Article | 18 June 2007 Paper

Photon-noise limited distance resolution of optical metrology methods

Peter Seitz

Proceedings Volume 6616, 66160D (2007) https://doi.org/10.1117/12.732040

KEYWORDS: Range imaging, Modulation, Light sources, Imaging systems, Optical metrology, Interferometry, Light, Distance measurement, Cameras, Phase measurement

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Proceedings Article | 26 January 2006 Paper

High-speed and high-sensitive demodulation pixel for 3D imaging

Bernhard Büttgen, Thierry Oggier, Michael Lehmann, Rolf Kaufmann, Simon Neukom, Michael Richter, Matthias Schweizer, David Beyeler, Roger Cook, Christiane Gimkiewicz, Claus Urban, Peter Metzler, Peter Seitz, Felix Lustenberger

Proceedings Volume 6056, 605603 (2006) https://doi.org/10.1117/12.642305

KEYWORDS: Modulation, Sensors, Demodulation, Cameras, Signal detection, Distance measurement, Diffusion, Electrons, Head, Image processing

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Proceedings Article | 10 September 2004 Paper

Smart pixels

Peter Seitz

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.554753

KEYWORDS: Image sensors, Cameras, Sensors, Image processing, Charge-coupled devices, Semiconductors, Silicon, Electronics, Analog electronics, CCD image sensors

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Proceedings Article | 1 September 2004 Paper

A time-of-flight line sensor: development and application

Rolf Kaufmann, Michael Lehmann, Matthias Schweizer, Michael Richter, Peter Metzler, Graham Lang, Thierry Oggier, Nicolas Blanc, Peter Seitz, Gabriel Gruener, Urs Zbinden

Proceedings Volume 5459, (2004) https://doi.org/10.1117/12.545571

KEYWORDS: Sensors, Distance measurement, Electrons, Phase measurement, Modulation, Cameras, Charge-coupled devices, Laser range finders, Imaging systems, Mobile robots

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Proceedings Article | 16 April 2004 Paper

Demonstration of a novel drift field pixel structure for the demodulation of modulated light waves with application in three-dimensional image capture

Bernhard Buttgen, Thierry Oggier, Rolf Kaufmann, Peter Seitz, Nicolas Blanc

Proceedings Volume 5302, (2004) https://doi.org/10.1117/12.525654

KEYWORDS: Demodulation, Modulation, Signal detection, Distance measurement, Electrons, Sensors, Camera shutters, Signal processing, 3D image processing, Diffusion

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Proceedings Article | 16 April 2004 Paper

Smart pixels for real-time optical coherence tomography

Stephan Beer, Philipp Zeller, Nicolas Blanc, Felix Lustenberger, Peter Seitz

Proceedings Volume 5302, (2004) https://doi.org/10.1117/12.525698

KEYWORDS: Optical coherence tomography, Sensors, Signal to noise ratio, Demodulation, Signal detection, Mirrors, Photons, Image sensors, 3D image processing, Modulation

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Proceedings Article | 19 February 2004 Paper

CCD and APS/CMOS technology for smart pixels and image sensors

Peter Seitz, Nicolas Blanc

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.517150

KEYWORDS: Image sensors, Charge-coupled devices, Image processing, Cameras, Sensors, CCD image sensors, Transistors, Silicon, Electronics, Semiconductors

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Proceedings Article | 2 October 2003 Paper

Video-rate optical coherence tomography imaging with smart pixels

Stephan Beer, Severin Waldis, Peter Seitz

Proceedings Volume 5140, (2003) https://doi.org/10.1117/12.500606

KEYWORDS: Optical coherence tomography, Demodulation, Sensors, Image sensors, Signal detection, Modulation, Coherence imaging, Imaging systems, Linear filtering, Optical imaging

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Proceedings Article | 15 May 2001 Paper

High-sensitivity high-dynamic digital CMOS imager

Martin Waeny, Steve Tanner, Stefan Lauxtermann, Nicolas Blanc, M. Willemin, Martin Rechsteiner, Elko Doering, Joachim Grupp, Peter Seitz, Fausto Pellandini, Michael Ansorge

Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426992

KEYWORDS: Imaging systems, Interference (communication), Signal to noise ratio, Sensors, Capacitance, Photodiodes, CMOS sensors, Signal detection, Image sensors, Capacitors

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Proceedings Article | 15 May 2001 Paper

Megapixel CMOS imager with charge binning

Stefan Lauxtermann, Alice Biber, Peter Schwider, Peter Metzler, Peter Seitz, Reiner Bidenbach

Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426944

KEYWORDS: Imaging systems, Sensors, CMOS technology, Cameras, Digital photography, Active sensors, CMOS sensors, Image resolution, Standards development, Light sources and illumination

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Proceedings Article | 15 May 2001 Paper

Low-power digital image sensor for still-picture image acquisition

Steve Tanner, Stefan Lauxtermann, Martin Waeny, M. Willemin, Nicolas Blanc, Joachim Grupp, Rudolf Dinger, Elko Doering, Michael Ansorge, Peter Seitz, Fausto Pellandini

Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426972

KEYWORDS: Camera shutters, Sensors, Image sensors, Transistors, Image acquisition, Analog electronics, Logic, Image processing, Image resolution, LCDs

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Proceedings Article | 15 May 2000 Paper

Demodulation pixels in CCD and CMOS technologies for time-of-flight ranging

Robert Lange, Peter Seitz, Alice Biber, Stefan Lauxtermann

Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385434

KEYWORDS: Demodulation, Modulation, Charge-coupled devices, Sensors, Diffusion, Distance measurement, Cameras, Phase shift keying, Signal processing, Photodiodes

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Proceedings Article | 15 September 1999 Paper

Real-time optical metrology for microsystem fabrication

Peter Seitz

Proceedings Volume 3825, (1999) https://doi.org/10.1117/12.364291

KEYWORDS: Optics manufacturing, Polymers, Microsystems, Microelectronics, Vertical cavity surface emitting lasers, Light sources, Light emitting diodes, Optical tomography, CMOS sensors, Optical metrology

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Proceedings Article | 9 September 1999 Paper

Time-of-flight range imaging with a custom solid state image sensor

Robert Lange, Peter Seitz, Alice Biber, Rudolf Schwarte

Proceedings Volume 3823, (1999) https://doi.org/10.1117/12.360988

KEYWORDS: Modulation, Sensors, Charge-coupled devices, Ranging, CCD image sensors, Light sources, Imaging systems, Cameras, Distance measurement, Diffusion

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Proceedings Article | 27 April 1999 Paper

Avalanche photodiode array in BiCMOS technology

Alice Biber, Peter Seitz

Proceedings Volume 3649, (1999) https://doi.org/10.1117/12.347083

KEYWORDS: Diodes, Avalanche photodiodes, Amplifiers, Avalanche photodetectors, Image sensors, Resistance, Electron holes, Transistors, Sensors, Quantum efficiency

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Proceedings Article | 7 September 1998 Paper

CMOS-compatible avalanche photodiodes

Alice Biber, Peter Seitz

Proceedings Volume 3410, (1998) https://doi.org/10.1117/12.323996

KEYWORDS: Diodes, Avalanche photodiodes, Doping, Quantum efficiency, Semiconductors, Avalanche photodetectors, Sensors, Diffusion, Imaging systems, Ionization

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Proceedings Article | 24 September 1997 Paper

Image sensing with maximum sensitivity using industrial CMOS technology

Peter Seitz

Proceedings Volume 3099, (1997) https://doi.org/10.1117/12.281222

KEYWORDS: Charge-coupled devices, Photodetectors, Avalanche photodetectors, Image sensors, Semiconductors, CCD image sensors, Silicon, Electrons, Photons, Capacitance

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Proceedings Article | 26 August 1996 Paper

Smart image sensors: an emerging key technology for advanced optical measurement and microsystems

Peter Seitz

Proceedings Volume 2783, (1996) https://doi.org/10.1117/12.248493

KEYWORDS: Image sensors, CCD image sensors, Charge-coupled devices, Analog electronics, Image processing, Electronics, Optical testing, Semiconductors, Sensors, Photodiodes

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Optical microsystems typically include photosensitive devices, analog preprocessing circuitry and digital signal processing electronics. The advances in semiconductor technology have made it possible today to integrate all photosensitive and electronical devices on one 'smart image sensor' or photo-ASIC (application-specific integrated circuits containing photosensitive elements). It is even possible to provide each 'smart pixel' with additional photoelectronic functionality, without compromising the fill factor substantially. This technological capability is the basis for advanced cameras and optical microsystems showing novel on-chip functionality: Single-chip cameras with on- chip analog-to-digital converters for less than $10 are advertised; image sensors have been developed including novel functionality such as real-time selectable pixel size and shape, the capability of performing arbitrary convolutions simultaneously with the exposure, as well as variable, programmable offset and sensitivity of the pixels leading to image sensors with a dynamic range exceeding 150 dB. Smart image sensors have been demonstrated offering synchronous detection and demodulation capabilities in each pixel (lock-in CCD), and conventional image sensors are combined with an on-chip digital processor for complete, single-chip image acquisition and processing systems. Technological problems of the monolithic integration of smart image sensors include offset non-uniformities, temperature variations of electronic properties, imperfect matching of circuit parameters, etc. These problems can often be overcome either by designing additional compensation circuitry or by providing digital correction routines. Where necessary for technological or economic reasons, smart image sensors can also be combined with or realized as hybrids, making use of commercially available electronic components. It is concluded that the possibilities offered by custom smart image sensors will influence the design and the performance of future electronic imaging systems in many disciplines, reaching from optical metrology to machine vision on the factory floor and in robotics applications.

Proceedings Article | 26 August 1996 Paper

High-resolution position encoder insensitive to misalignment

Kai Engelhardt, Peter Seitz

Proceedings Volume 2783, (1996) https://doi.org/10.1117/12.248487

KEYWORDS: Computer programming, Sensors, Tolerancing, Imaging systems, Modulation, Head, Photodiodes, Signal detection, Glasses, Moire patterns

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Proceedings Article | 25 March 1996 Paper

Image sensing with programmable offset pixels for increased dynamic range of more than 150 dB

Oliver Vietze, Peter Seitz

Proceedings Volume 2654, (1996) https://doi.org/10.1117/12.236088

KEYWORDS: Sensors, Imaging systems, Transistors, Photodetectors, Capacitance, Photodiodes, Computer programming, Signal detection, Capacitors, Switches

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SPIE Journal Paper | 1 August 1995

Smart sensing using custom photo-application-specific integrated circuits and charge-coupled device technology

Peter Seitz, Thomas Spirig, Oliver Vietze, Kai Engelhardt

OE, Vol. 34, Issue 08, (August 1995) https://doi.org/10.1117/12.10.1117/12.200595

KEYWORDS: Charge-coupled devices, CCD image sensors, Integrated circuits, Fabrication, Optical testing, Smart sensors, Image processing, Image sensors, Semiconductors, Optical sensing

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Proceedings Article | 10 April 1995 Paper

Lock-in CCD and the convolver CCD: applications of exposure-concurrent photocharge transfer in optical metrology and machine vision

Peter Seitz, Thomas Spirig, Oliver Vietze, Peter Metzler

Proceedings Volume 2415, (1995) https://doi.org/10.1117/12.206523

KEYWORDS: Charge-coupled devices, CCD image sensors, Convolution, Image sensors, Modulation, Microscopes, Cameras, Clocks, Analog electronics, Control systems

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Proceedings Article | 5 May 1994 Paper

Modular image acquisition and measurement system with 12-bit pixel-synchronous sampling

Jeffrey Raynor, Daniel Ilar, Roland Maag, Peter Metzler, Peter Seitz

Proceedings Volume 2173, (1994) https://doi.org/10.1117/12.175154

KEYWORDS: Video, Analog electronics, Power supplies, Imaging systems, Cameras, Signal to noise ratio, Clocks, Data acquisition, Digital signal processing, Sensors

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Proceedings Article | 11 March 1994 Paper

Active machine vision system for surface quality inspection

Cor Claeys, Ingrid Debusschere, Nico Ricquier, Peter Seitz, Martin Stalder, Jeffrey Raynor, Graham Lang, Giuseppe Cilia, C. Cavanna, U. Muessigmann, A. Abele

Proceedings Volume 2183, (1994) https://doi.org/10.1117/12.171209

KEYWORDS: Inspection, Image sensors, Holograms, Zoom lenses, Fractal analysis, Image processing, Image resolution, Convolution, Mirrors, Digital holography

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Proceedings Article | 29 December 1993 Paper

Real-time digital color processor for a programmable, high-resolution CCD camera with high colorimetric accuracy

Jeffrey Raynor, Peter Seitz, Peter Metzler, Kai Engelhardt, Michael Gale

Proceedings Volume 1987, (1993) https://doi.org/10.1117/12.165214

KEYWORDS: Cameras, Imaging systems, Sensors, Signal processing, Charge-coupled devices, Digital signal processing, Image processing, Image resolution, CCD cameras, Optical filters

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Proceedings Article | 29 December 1993 Paper

Integrated, dynamic machine vision system with virtual high resolution

Peter Seitz, Martin Stalder, Jeffrey Raynor, Graham Lang, Cor Claeys, Ingrid Debusschere, Nico Ricquier, Giuseppe Cilia, C. Cavanna, U. Muessigmann, A. Abele

Proceedings Volume 1987, (1993) https://doi.org/10.1117/12.165212

KEYWORDS: Image processing, Inspection, Image sensors, Active vision, Holograms, Zoom lenses, Cameras, Machine vision, Imaging systems, Fractal analysis

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Proceedings Article | 29 December 1993 Paper

Optimum color filters for CCD digital cameras

Kai Engelhardt, Rino Kunz, Peter Seitz, Harald Brunner, Karl Knop

Proceedings Volume 1987, (1993) https://doi.org/10.1117/12.165215

KEYWORDS: Optical filters, Cameras, Dielectric filters, Imaging systems, CCD cameras, Sensors, Charge-coupled devices, Interference (communication), Quantization, Lens design

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Proceedings Article | 12 July 1993 Paper

Smart optical and image sensors fabricated with industrial CMOS/CCD semiconductor processes

Peter Seitz, Dirk Leipold, Joerg Kramer, Jeffrey Raynor

Proceedings Volume 1900, (1993) https://doi.org/10.1117/12.148605

KEYWORDS: Charge-coupled devices, Image processing, Sensors, Image sensors, CCD image sensors, Analog electronics, Cameras, Photodiodes, Semiconductors, Digital electronics

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Proceedings Article | 1 November 1991 Paper

Using local orientation and hierarchical spatial feature matching for the robust recognition of objects

Peter Seitz, Graham Lang

Proceedings Volume 1606, (1991) https://doi.org/10.1117/12.50340

KEYWORDS: Binary data, Image processing, Detection and tracking algorithms, Object recognition, Hough transforms, Tolerancing, Visual communications, Neural networks, Sensors, Linear filtering

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Proceedings Article | 1 August 1990 Paper

Locometer: on-line inspection of locomotive wheel to rail movements using high precision CCD metrology

Peter Seitz, Michael Gale, Heinrich Meier, Jeffrey Raynor, P. Wolff, M. Hecht

Proceedings Volume 1266, (1990) https://doi.org/10.1117/12.20256

KEYWORDS: Head, CCD cameras, Video, Data acquisition, Charge-coupled devices, Cameras, Optical testing, Metrology, Dielectric filters, Inspection

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Proceedings Article | 1 August 1990 Paper

Universal pixel-synchronous data acquisition system for high-resolution CCD image sensors

Jeffrey Raynor, Peter Seitz, D. Wanner

Proceedings Volume 1265, (1990) https://doi.org/10.1117/12.20243

KEYWORDS: Data acquisition, CCD image sensors, Computing systems, Sensors, Video, CCD cameras, Cameras, Clocks, Optical metrology, Charge-coupled devices

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