Stoichiometric defects in glasses play a critical role in determining its optical properties. Defect types in silica and germanosilicates are briefly reviewed. Passive components in fibers based on stoichiometric defects, such as Bragg and long period gratings have been developed and used extensively in high reliability applications. Approach to analyze thermally associated changes in these gratings over time is outlined. The applicability of the approach to other defect related phenomena such as hydrogen induced loss in optical fibers is also described.
In this paper we describe a single kinetic model consistent with current experimental results of the effect of hydrogen on erbium doped fiber, and derive three approximations to the model that can be used to fit data from fiber. Fits to data are shown for two of the three models.
This paper reviews the applicability of the mastercurve method for analyzing diverse reliability issues in fiber optics. Approaches to assess and predict small changes in optical properties of fiber gratings caused by thermally induced decrease in refractive index modulation, are presented and compared. The process of thermal stabilization to obtain gratings with excellent stability is explained. It is shown that the mastercurve approach when suitably modified could be used to analyze other reliability problems such as hydrogen induced loss and radiation induced effects in fibers.
Ultraviolet laser radiation induces a myriad of effects in silica glasses and fibers. This study deals with the absorption and luminescence characteristics of silica manufactured by different methods, containing varying amounts of water -- broadly grouped into the ultra dry, moderately wet, and very wet types. The effect of 248 nm (KrF) excimer laser radiation on these characteristics is examined. The effects seen in the bulk form are contrasted with those seen in drawn fibers, in particular, with regards to the luminescence behavior.
Conference Committee Involvement (1)
Reliability of Optical Fiber Components, Devices, Systems, and Networks III
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