Sunil P. Jaiswal
at Hong Kong Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 April 2016 Paper
Proceedings Volume 9783, 978333 (2016) https://doi.org/10.1117/12.2216918
KEYWORDS: Metals, Data hiding, Reconstruction algorithms, Optical imaging, Magnetic resonance imaging, Ultrasonography, Image restoration, Computed tomography, Single photon emission computed tomography, Defect detection, X-ray computed tomography, Medical imaging, Image quality, Surgery, Spine, Printed circuit board testing, Electronics

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