Mr. Tomáš Koutecký Profile

Tomáš Koutecký

Assistant Professor at Brno University of Technology

SPIE Involvement:

Author

Publications (2)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 15 August 2023 Presentation + Paper

Photogrammetry for optical metrology of parts manufactured by additive manufacturing

Adam Semančík, Jakub Hynek, Samuel Lukačovič, Tomáš Koutecký

Proceedings Volume 12618, 126180K (2023) https://doi.org/10.1117/12.2673700

KEYWORDS: Cameras, Point clouds, Photogrammetry, Stereoscopic cameras, Calibration, Additive manufacturing, Image resolution, Metrology

Read Abstract +

The aim of this paper was to test the suitability of using photogrammetry for metal additively manufactured parts with respect to metrology applications. Another aim was to test the influence of the chosen parameters on the quality indicators of the measurement data and the suitability of using single and stereo camera setups. The parameters of the measurement system whose influence was assessed were the exposure time, number and resolution of images taken. The individual measurements were evaluated in terms of the computational complexity, number of points obtained, part coverage ratio and the standard deviation of the distances of all points from the surface of the reference model. By comparing the results, a matrix of optimal parameters for the given part types was created and further trends describing the influence of individual parameters on the results were observed. The experimental comparison performed shows the possibilities of photogrammetric measurements, gives an idea of the appropriate parameters settings and has also shown that photogrammetry can be a competitor to fringe projection scanning of metal additively manufactured parts. The main drawback of this method is still the computational time and the need for a distinctive surface texture.

Proceedings Article | 22 June 2015 Paper

Application of a reflectance model to the sensor planning system

Tomáš Koutecký, David Paloušek, Jan Brandejs

Proceedings Volume 9530, 953005 (2015) https://doi.org/10.1117/12.2184890

KEYWORDS: Reflectivity, Sensors, Metals, Inspection, Reflection, Cameras, Solid modeling, Visibility, 3D modeling, 3D scanning

Read Abstract +

This study describes a new sensor planning system for the automatic generation of scanning positions based on a computer model of the part for digitization of sheet metal parts. The focus of this paper is in the application of a reflectance model into this sensor planning system. The goal of this sensor planning system and application of this model is to ensure fast, complete and accurate digitization of the parts for their inspection during serial-line production, especially in the automotive industry. A methodology of the sensor planning system consists of positions planning, their simulation for true visibility of the part elements using a reflectance model, and a simulation of the positions for robot reachability. Compared to previous studies, visual properties of the scanned parts’ surface can be simulated precisely. The Nayar model is used as a reflectance model. This model is suitable for materials that are characterized by the combination of diffuse and specular reflections and uses three components of reflection: diffuse, specular lobe and specular spike. Results of the scanning that were obtained using an ATOS III Triple Scan fringe projection 3D scanner and a KUKA KR 60 HA industrial robot were compared to the simulation. The comparison based on the correspondence of the polygons area acquired in each sensor position (in simulation and in scanning) shows that in the performed measurements the median of differences between simulation and scanning is around 16%.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years