Dr. William B. Thompson Profile

Dr. William B. Thompson

Research Scientist at SLAC

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 1 June 2011 Paper

Creating nanohole arrays with the helium ion microscope

Mohan Ananth, Lewis Stern, David Ferranti, Chuong Huynh, John Notte, Larry Scipioni, Colin Sanford, Bill Thompson

Proceedings Volume 8036, 80360M (2011) https://doi.org/10.1117/12.887497

KEYWORDS: Gold, Chemical species, Sputter deposition, Ions, Image resolution, Scanning electron microscopy, Scanning helium ion microscopy, Ion beams, Helium, Gallium

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Proceedings Article | 3 June 2010 Paper

Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

William Thompson, Lewis Stern, Dave Ferranti, Chuong Huynh, Larry Scipioni, John Notte, Colin Sanford

Proceedings Volume 7729, 77290J (2010) https://doi.org/10.1117/12.861488

KEYWORDS: Oxides, Carbon, Contamination, Argon, Copper, Ions, Scanning helium ion microscopy, Helium, Carbon monoxide, Plasma

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Proceedings Article | 19 May 1995 Paper

Toward a commercial gas field ion source

William Thompson, A. Armstrong, S. Etchin, Raymond Hill, Sigfried Kalbitzer, R. Percival, A. Saxonis, Christoph Wilbertz

Proceedings Volume 2437, (1995) https://doi.org/10.1117/12.209185

KEYWORDS: Optical spheres, Interferometers, Argon, Tungsten, Ions, Ion beams, Helium, Neon, Gallium, Liquids

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Proceedings Article | 13 May 1994 Paper

Advances in focused ion-beam repair of opaque defects

David Ferranti, John Morgan, William Thompson, William Joyce

Proceedings Volume 2194, (1994) https://doi.org/10.1117/12.175828

KEYWORDS: Opacity, Etching, Quartz, Sputter deposition, Glasses, Ions, Ion beams, Photomasks, Gallium, Phase shifts

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Proceedings Article | 1 June 1992 Paper

Focused ion-beam process monitoring

William Thompson, Randall Lee

Proceedings Volume 1673, (1992) https://doi.org/10.1117/12.59828

KEYWORDS: Oxides, Imaging systems, Metals, Image processing, Microchannel plates, Electrons, Ions, Ion beams, Semiconducting wafers, Gallium

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Proceedings Volume Editor (1)

SPIE Conference Volume | 3 September 1993

Charged-Particle Optics

Conference Committee Involvement (1)

Charged-Particle Optics

15 July 1993 | San Diego, CA, United States

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