Yi-Kun Xiong
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 9 October 2021 Poster + Paper
Proceedings Volume 11899, 118990W (2021) https://doi.org/10.1117/12.2600719
KEYWORDS: Laser scanners, Inspection, 3D metrology, 3D modeling, 3D scanning, Manufacturing, Clouds, Laser optics, Metrology, Measurement devices

Proceedings Article | 10 October 2020 Poster + Presentation + Paper
Proceedings Volume 11552, 1155213 (2020) https://doi.org/10.1117/12.2573168
KEYWORDS: Calibration, 3D scanning, Optical scanning, Optical calibration, 3D metrology, Optical spheres, Optics manufacturing, Inspection, 3D imaging standards, Clouds

Proceedings Article | 10 October 2020 Poster + Paper
Proceedings Volume 11556, 115560L (2020) https://doi.org/10.1117/12.2572688
KEYWORDS: Scanning probe microscopes, 3D metrology, Semiconductor manufacturing, Space reconnaissance, 3D scanning, Solids, Image resolution, Calibration

Proceedings Article | 6 May 2019 Paper
Proceedings Volume 11069, 110692Z (2019) https://doi.org/10.1117/12.2524385
KEYWORDS: Optical scanning, Calibration, Spherical lenses, Optical calibration, Optical testing, Distance measurement, Metrology, Scanners, Error analysis

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