Yue Shi
at Chengdu University of Information Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 December 2017 Paper
Zekun Zhou, Hongming Yu, Yue Shi, Bo Zhang
Proceedings Volume 10613, 106130I (2017) https://doi.org/10.1117/12.2300345
KEYWORDS: Temperature metrology, Transistors, Signal processing, Power supplies, Analog electronics, Resistors, Negative feedback, Semiconductors, Intelligence systems, Feedback loops

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