In recent years, semiconductor demands have been growing to support on-line activity. And the needs of productivity improvement amongst chipmaker is higher than ever. ArFi light source’s modules life shall be targeting to one year cycle, and light source’s availability is improving is subjected as push to the limit and demonstrating an improvement year over year. To improve wafer output efficiency more, we need to focus not only on module lifetime extension but focus on to lithocell availability improvement which enabled by the alignment with PM time slot of the other scanner’s sub modules or chipmaker’s production cycle requirement in multiple year scale. Given these facts, this paper discusses Availability Maximization software function as Availability Maximization which is supported by the lightsource’s module replacement cycle extension by introducing emerging technologies and maintenance time reduction and optimization to fit into lithocell PM slot. Therefore, it provides the highest tool availability to chipmaker HVM environment invented by Giagaphoton’s unique and comprehensive solution.
In the semiconductor industry, optical projection lithography is employed for the production of microchips. In this process ultraviolet radiation has been used to exposure of photoresists on silicon wafers. Light sources with shorter wavelength are needed to shrink the chip size due to the diffraction limit. Pulsed excimer lasers have been used since the middle of 1990s instead of mercury lamps. At first KrF lasers (248-nm) were adopted, then ArF lasers (193-nm) have been applied to satisfy tighter leading edge device requirements. Now almost 5,000 excimer lasers for lithography tools are being operated at the world-wide semiconductor fab with stable, its availability up to 99.8%. The latest ArF excimer laser can pulse 15mJ to 20mJ energy with 6-kHz repetition rate, its typical module lifetime which can be replaced is several dozen Billion pulses. The module lifetime are expected to expand to reduce the downtime to replace. Also for precise micromachining applications, ArF hybrid laser consists of all-solid-state DUV light source as a seed laser and excimer laser as amplifier is been developed. The pulse width of this laser is typically sub-nanosecond and its high peak power is another concern for laser optics. Generally, the lifespan of optical elements has been growing to reach 100 Bpls, and its evaluation takes a very long time, typically several years. Comprehensive durability evaluation becomes more efficient by creating accelerated element tests [1]. As an alternative, accelerated lifetime testing with high fluence are helpful approach to screen and select the optics to satisfy the lifetime requirement. We have been developing the accelerated test system to determinate the laser-induced damage threshold of optical surfaces. In this paper, the test system and some results of field-approved optics with 20ns pulse duration will be explained.
The lifetime of optics, especially windows, has grown to reach 100 Bpls, and its evaluation lasts for several years at least. In elementary testing (short term), focusing on each damage phenomenon must be established. The degradation of calcium fluoride windows used as laser chamber windows in ArF excimer lasers (193-nm wavelength, 30-ns pulse width, 10-mJ output energy, ~80-mJ/cm2, 6-kHz and several dozen billion pulses) is analyzed. The results of analysis such as TEM-EDX, Nomarski-type differential interference contrast (DIC) microscope, AFM, etc. is shown. The damage mechanism can be estimated from these results. Comprehensive durability evaluation becomes more efficient by creating accelerated element tests (short term).
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