Indranil Mitra
Chemical Engineer at Univ of Houston
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 March 2015 Paper
Proceedings Volume 9423, 942320 (2015) https://doi.org/10.1117/12.2085676
KEYWORDS: Polymethylmethacrylate, Interfaces, Scattering, Annealing, Thin films, Silicon, Lithography, Picosecond phenomena, Scanning electron microscopy, Microscopy

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