Measurements of electronic nonlinearity of poly-4BCMU waveguide with surface plasma excitation

Jun Zhou; Yingli Chen; Zhuangqi Cao; Jianhua Liu; Yinqiao Zhao; Heyuan Zhu; Diechi Sun; Fuming Li

doi:10.1117/12.252962

3 October 1996 Measurements of electronic nonlinearity of poly-4BCMU waveguide with surface plasma excitation

Jun Zhou, Yingli Chen, Zhuangqi Cao, Jianhua Liu, Yinqiao Zhao, Heyuan Zhu, Diechi Sun, Fuming Li

Proceedings Volume 2897, Electro-Optic and Second Harmonic Generation Materials, Devices, and Applications; (1996) https://doi.org/10.1117/12.252962
Event: Photonics China '96, 1996, Beijing, China

Abstract

In this paper, our study is concerned with the metal-clad poly-4 BCMU film waveguide. The Kretschmann configuration of ATR techniques has been used to excite surface plasma wave, and the third nonlinear susceptibility (chi) ⁽³) of the poly-4BCMU film is measured. This method is extremely sensitive for the change of refractive index of the waveguide, it can be served as a useful probe means for monolayer organic films. Another advantage of the method is that the signs of the nonlinear refract index n₂^NL of the organic film can be obtained in the experiment.

Citation Download Citation

Jun Zhou, Yingli Chen, Zhuangqi Cao, Jianhua Liu, Yinqiao Zhao, Heyuan Zhu, Diechi Sun, and Fuming Li "Measurements of electronic nonlinearity of poly-4BCMU waveguide with surface plasma excitation", Proc. SPIE 2897, Electro-Optic and Second Harmonic Generation Materials, Devices, and Applications, (3 October 1996); https://doi.org/10.1117/12.252962

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KEYWORDS

Silver

Plasma

Dielectrics

Refractive index

Waveguides

Reflectivity

Prisms

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