Stereometric Quality Of Scanning Electron Microscope Imagery

J. D. Eick; L. N. Johnson; R. F. McGivern

doi:10.1117/12.975334

1 June 1971 Stereometric Quality Of Scanning Electron Microscope Imagery

J. D. Eick, L. N. Johnson, R. F. McGivern

Proceedings Volume 0026, Quantitative Imagery in the Biomedical Sciences I; (1971) https://doi.org/10.1117/12.975334
Event: Quantitative Imagery in the Biomedical Sciences I, 1971, Houston, United States

Abstract

The recent development of the scanning electron microscope (SEM) has added a new dimension to the field of microscopy. The SEM produces an image having considerable depth of focus; for example, approximately 400 times that of a light microscope at equivalent magnifications. It can be operated continuously between magnifications of 20 and 100,000X with a resolution of approximately 100 Å.

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J. D. Eick, L. N. Johnson, and R. F. McGivern "Stereometric Quality Of Scanning Electron Microscope Imagery", Proc. SPIE 0026, Quantitative Imagery in the Biomedical Sciences I, (1 June 1971); https://doi.org/10.1117/12.975334

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