Paper
29 August 1977 Microchannel Plate Response To Hard X-Rays
K. W. Dolan, J. Chang
Author Affiliations +
Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955470
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
We have measured both the current response and the pulse response of a microchannel plate, MCP, to X-rays incident at an angle of 45° in the energy range of 8 to 100 keV. The X-ray detection efficiency, pulse height distributions, and sensitive depth of the MCP were determined from these data. We find that detection efficiency extrapolates to zero below 8 keV, and ranges between values of 1% and 2.6% above this energy, much higher than anticipated from previous measurements for oblique incidence below 6 keV. When compared to previous measurements at higher energies, we conclude that MCP's have a relatively constant detection efficiency in the energy range 10 to 600 keV, which is a rather unique property as compared to other X-ray detectors. We find that the shape of current response curves differs somewhat from the shape of efficiency curves, that pulse height distributions are proportional to pulse height to the -1.1 to -1.6 power, and that 90% of the current ori-ginates in the first 25 to 30% of the MCP thickness.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. W. Dolan and J. Chang "Microchannel Plate Response To Hard X-Rays", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); https://doi.org/10.1117/12.955470
Lens.org Logo
CITATIONS
Cited by 20 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microchannel plates

X-rays

Absorption

Energy efficiency

Lead

Interference (communication)

X-ray imaging

RELATED CONTENT

High-resolution x-ray image sensors based on HgI2
Proceedings of SPIE (December 18 2000)
New type of x ray wafer image intensifier with CsI...
Proceedings of SPIE (April 01 1993)
PbO as direct conversion x-ray detector material
Proceedings of SPIE (May 06 2004)
New MCP reflection x ray sensitive film of variable density...
Proceedings of SPIE (September 20 2002)
High-speed hard x-ray phase-enhanced imaging
Proceedings of SPIE (January 11 2007)

Back to Top