Pinhole Imaging Techniques For Hard X-Rays

A. J. Toepfer; L. P. Mix; H. J. TrusselI

doi:10.1117/12.955455

29 August 1977 Pinhole Imaging Techniques For Hard X-Rays

A. J. Toepfer, L. P. Mix, H. J. TrusselI

Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955455
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States

Abstract

Numerical image processing techniques have been applied to the restoration of x-ray pinhole photographs of solid targets irradiated by intense relativistic electron beams. An experimentally determined point spread function for the pinhole camera was utilized to eliminate the effects of high energy x-ray degradation of pin-hole resolution. Spatially resolved measurements of x-ray yield were made by measuring the dose to calibrated film and calculating the exposure using Monte-Carlo electron-photon transport calculations.

Citation Download Citation

A. J. Toepfer, L. P. Mix, and H. J. TrusselI "Pinhole Imaging Techniques For Hard X-Rays", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); https://doi.org/10.1117/12.955455

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