Wavefront Evaluation On Laser Diodes Using A Phase Measurement Interferometer

Kang M. Leung; Steven R. Lange

doi:10.1117/12.936337

15 November 1983 Wavefront Evaluation On Laser Diodes Using A Phase Measurement Interferometer

Kang M. Leung, Steven R. Lange

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936337
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

To implement a semiconductor laser diode for use in high density optical data storage systems, the output laser beam must be first collimated and then focussed to a near diffraction-limited spot. Therefore, it is essential to know both the beam intensity profile and the phase distribution of the laser wavefront with high precision on the order of one fiftieth of a wavelength. This measurement is important to both the laser diode manufacturers and users. In this paper, we will describe how the wavefront of a laser diode collimator pen was measured by using a state-of-the-art phase measurement interferometer built by WYKO Optical, Inc. Performance of this interferometer is evaluated using both He-Ne and diode lasers.

Citation Download Citation

Kang M. Leung and Steven R. Lange "Wavefront Evaluation On Laser Diodes Using A Phase Measurement Interferometer", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936337

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