Accessories For Micro-Emission FTIR And Their Performance

James L. Lauer; Peter Vogel

doi:10.1117/12.970795

20 December 1985 Accessories For Micro-Emission FTIR And Their Performance

James L. Lauer, Peter Vogel

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970795
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

Micro-emission FTIR (MEFTIR) is a most sensitive technique for the analysis of non-uniform surface layers. It is non-destructive, requires no sample preparation, can be used in an ambient environment, with flat or even rough surfaces, at high and low temperatures, and it requires only microscopic sample areas. In contrast to reflection methods, MEFTIR does not need precise angles of observation and its dynamic range requirement is small, since differencing is not involved. However, its sensitivity depends on wave-length by Planck's law.

Citation Download Citation

James L. Lauer and Peter Vogel "Accessories For Micro-Emission FTIR And Their Performance", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970795

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