"Continuous" Pulsed Electronic Speckle Pattern Interferometry

John R. Tyrer

doi:10.1117/12.937913

26 August 1987 "Continuous" Pulsed Electronic Speckle Pattern Interferometry

John R. Tyrer

Proceedings Volume 0732, 1st Intl Conf on Vibration Control in Optics and Metrology; (1987) https://doi.org/10.1117/12.937913
Event: 1st International Conference on Vibrational Control in Optics and Metrology, 1987, London, United Kingdom

Abstract

Holography and allied techliques such as electronic speckle pattern interferometry (ESPI) have the potential to provide the engineer with a powerful measuring technique. Why, therefore, is it not a technique readily available and widely used? Several arguments can be put forward; complexity, skill level, ease of use, in-situ capability, and ability to interpret results.

Citation Download Citation

John R. Tyrer ""Continuous" Pulsed Electronic Speckle Pattern Interferometry", Proc. SPIE 0732, 1st Intl Conf on Vibration Control in Optics and Metrology, (26 August 1987); https://doi.org/10.1117/12.937913

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