Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology

Ole J. Lokberg; Jan T. Malmo

doi:10.1117/12.943496

1 June 1988 Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology

Ole J. Lokberg, Jan T. Malmo

Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943496
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France

Abstract

The introduction of compact, robust and stable ESPI-instruments has opened for new applications of the technique outside the laboratory environments. We briefly describe a typical system and discuss how it may be used in hostile environments to measure on difficult objects.

Citation Download Citation

Ole J. Lokberg and Jan T. Malmo "Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); https://doi.org/10.1117/12.943496

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