Quality Control Using Optical Probe Arrays

Robert M. Stewart

doi:10.1117/12.947632

16 January 1989 Quality Control Using Optical Probe Arrays

Robert M. Stewart

Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947632
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States

Abstract

Low cost, optical probes, can be combined into an inspection array, and the go/no-go outputs can be analyzed by a high speed programmable logic controller (PLC). The PLC can be remotely addressed to change the desired level of quality control. The PLC can provide on-line data for blow-by-blow statistical process control (SPC).

Citation Download Citation

Robert M. Stewart "Quality Control Using Optical Probe Arrays", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947632

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available