Coherent light 3D materials microscopy without phase retrieval

Jian Xing; Jiun-Yann Yu; Simeng Chen; Carol Cogswell

doi:10.1117/12.2272800

24 February 2017 Coherent light 3D materials microscopy without phase retrieval

Jian Xing, Jiun-Yann Yu, Simeng Chen, Carol Cogswell

Proceedings Volume 10070, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV; 100701N (2017) https://doi.org/10.1117/12.2272800
Event: SPIE BiOS, 2017, San Francisco, California, United States

Abstract

We report a novel microscopy technique, utilizing our previously reported expanded point information content (EPIC) concept [1], to extend the technique into the coherent regime. Preliminary data shows coherent EPIC (CoEPIC) can image reflective samples successfully, and can recover the 3D structure without the need to acquire an image stack at multiple depths. Numerical simulation demonstrates the potential super-resolution capability of CoEPIC.

Citation Download Citation

Jian Xing, Jiun-Yann Yu, Simeng Chen, and Carol Cogswell "Coherent light 3D materials microscopy without phase retrieval", Proc. SPIE 10070, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV, 100701N (24 February 2017); https://doi.org/10.1117/12.2272800

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