Scanning Laser Photocurrent Spectroscopy Of Electrochemically Grown Bismuth Sulphide Films

Anthony R. Kucernaki; Robert Peat; David E. Williams

doi:10.1117/12.950346

9 February 1989 Scanning Laser Photocurrent Spectroscopy Of Electrochemically Grown Bismuth Sulphide Films

Anthony R. Kucernaki, Robert Peat, David E. Williams

Proceedings Volume 1028, Scanning Imaging; (1989) https://doi.org/10.1117/12.950346
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

The photoelectrochemical properties of semiconducting bismuth sulphide (Bi₂S₃) films (in contact with an aqueous electrolyte) grown on bismuth have been investigated. Using an Optically Beam Induced Contrast (OBIC) technique, it has been possible to image these films, and to identify local variations corresponding to grain boundaries and other recombination centres. It is seen that the form of these regions varies with the thickness of the film. Both object scanning and beam scanning have been investigated for generating images and these two methods are compared. Samples have also been investigated by Intensity Modulated Photocurrent Spectroscopy (IMPS). This method involves sinusoidal intensity modulation of the incident laser radiation at different frequencies, and the analysis of the resulting photocurrent response. Our extension of this method has been to map the IMPS response over the specimen surface in order to obtain specific information on local properties.

Citation Download Citation

Anthony R. Kucernaki, Robert Peat, and David E. Williams "Scanning Laser Photocurrent Spectroscopy Of Electrochemically Grown Bismuth Sulphide Films", Proc. SPIE 1028, Scanning Imaging, (9 February 1989); https://doi.org/10.1117/12.950346

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