Phase A: calibration concepts for HIRES

Philipp Huke; Livia Origlia; Marco Riva; Jake Charsley; Richard McCracken; Derryck Reid; Grzegorz Kowzan; Piotr Maslowski; Karen Disseau; Sebastian Schäfer; Christopher Broeg; Mirsad Sarajlic; François Dolon; Heidi Korhonen; Ansgar Reiners; Isabelle Boisse; Sandrine Perruchot; Sebastien Ottogalli; Francesco Pepe; Ernesto Oliva

doi:10.1117/12.2271782

26 June 2017 Phase A: calibration concepts for HIRES

Philipp Huke, Livia Origlia, Marco Riva, Jake Charsley, Richard McCracken, Derryck Reid, Grzegorz Kowzan, Piotr Maslowski, Karen Disseau, Sebastian Schäfer, Christopher Broeg, Mirsad Sarajlic, François Dolon, Heidi Korhonen, Ansgar Reiners, Isabelle Boisse, Sandrine Perruchot, Sebastien Ottogalli, Francesco Pepe, Ernesto Oliva

Author Affiliations +

Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 103292M (2017) https://doi.org/10.1117/12.2271782
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

The instrumentation plan for the E-ELT foresees a High Resolution Spectrograph (HIRES). Among its main goals are the detection of atmospheres of exoplanets and the determination of fundamental physical constants. For this, high radial velocity precision and accuracy are required. HIRES will be designed for maximum intrinsic stability. Systematic errors from effects like intrapixel variations or random errors like fiber noise need to be calibrated. Based on the main requirements for the calibration of HIRES, we discuss different potential calibration sources and how they can be applied. We outline the frequency calibration concept for HIRES using these sources.

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Philipp Huke, Livia Origlia, Marco Riva, Jake Charsley, Richard McCracken, Derryck Reid, Grzegorz Kowzan, Piotr Maslowski, Karen Disseau, Sebastian Schäfer, Christopher Broeg, Mirsad Sarajlic, François Dolon, Heidi Korhonen, Ansgar Reiners, Isabelle Boisse, Sandrine Perruchot, Sebastien Ottogalli, Francesco Pepe, and Ernesto Oliva "Phase A: calibration concepts for HIRES", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103292M (26 June 2017); https://doi.org/10.1117/12.2271782

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