Paper
21 July 2017 Optimized fast spectral sampling for adaptive Fourier ptychographic microscopy
Author Affiliations +
Proceedings Volume 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017); 104201P (2017) https://doi.org/10.1117/12.2281558
Event: Ninth International Conference on Digital Image Processing (ICDIP 2017), 2017, Hong Kong, China
Abstract
The conventional Fourier ptychographic microscopy (FPM) is a computational imaging approach, which stitches together a sequence of low-resolution (LR) images captured by different angles illumination. However, the limitation of processing efficiency in capturing LR images is gradually becoming obvious. Utilizing the principle, aimed at reducing the amount of captured measurements and decreasing acquisition time, this paper proposes an optimized spectral sampling scheme. In this method, the importance of the spectra in the spectrum domain is analyzed and the more informative parts are selected. The acquisition efficiency can be increased because the selected images are captured and applied into the conventional FPM routine. Compared with the conventional FPM, experimental results significantly indicate that the redundancy of information and the time of image collection could decrease without debasing the quality of the reconstruction.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sining Chen, Tingfa Xu, Jizhou Zhang, Bo Huang, and Xing Wang "Optimized fast spectral sampling for adaptive Fourier ptychographic microscopy", Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104201P (21 July 2017); https://doi.org/10.1117/12.2281558
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image restoration

Microscopy

Back to Top