Paper
23 February 2018 Quantitative phase microscopy using deep neural networks
Shuai Li, Ayan Sinha, Justin Lee, George Barbastathis
Author Affiliations +
Proceedings Volume 10503, Quantitative Phase Imaging IV; 105032D (2018) https://doi.org/10.1117/12.2289056
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
Deep learning has been proven to achieve ground-breaking accuracy in various tasks. In this paper, we implemented a deep neural network (DNN) to achieve phase retrieval in a wide-field microscope. Our DNN utilized the residual neural network (ResNet) architecture and was trained using the data generated by a phase SLM. The results showed that our DNN was able to reconstruct the profile of the phase target qualitatively. In the meantime, large error still existed, which indicated that our approach still need to be improved.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuai Li, Ayan Sinha, Justin Lee, and George Barbastathis "Quantitative phase microscopy using deep neural networks", Proc. SPIE 10503, Quantitative Phase Imaging IV, 105032D (23 February 2018); https://doi.org/10.1117/12.2289056
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Spatial light modulators

Diffraction

Neural networks

Microscopy

Calibration

Modulation

Phase retrieval

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