Characterization of Redlen CZT detectors for hard x-ray astronomy

Sean N. Pike; Fiona A. Harrison; Jill A. Burnham; Walter Cook; Brian W. Grefenstette; Kristin K. Madsen; Hiromasa Miyasaka; Julian M. Sanders; Andrew A. Sosanya

doi:10.1117/12.2321990

13 September 2018 Characterization of Redlen CZT detectors for hard x-ray astronomy

Sean N. Pike, Fiona A. Harrison, Jill A. Burnham, Walter Cook, Brian W. Grefenstette, Kristin K. Madsen, Hiromasa Miyasaka, Julian M. Sanders, Andrew A. Sosanya

Author Affiliations +

Proceedings Volume 10762, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX; 1076214 (2018) https://doi.org/10.1117/12.2321990
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

We present the results of ongoing characterization of Cadmium Zinc Telluride (CZT) semiconductors produced by Redlen Technologies. In particular we hope to determine their viability for future X-ray astronomy missions such as the High Energy X-ray Probe (HEX-P). The fully fabricated hybrid detectors consist of CZT crystals with a collecting area of 2 cm × 2 cm and thickness of 3 mm mounted on a custom pixelated ASIC originally designed for the Nuclear Spectroscopic Telescope Array (NuSTAR) mission, which launched in 2012. We present the results of inter-pixel conductance and leakage current tests as well as spectral characterization using an ²⁴¹Am source. Although further calibration and testing is necessary to determine the capabilities of these detectors, preliminary results indicate that Redlen CZT will be able to achieve spectral resolution and noise levels comparable to those of the CZT detectors currently in use aboard NuSTAR.

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Sean N. Pike, Fiona A. Harrison, Jill A. Burnham, Walter Cook, Brian W. Grefenstette, Kristin K. Madsen, Hiromasa Miyasaka, Julian M. Sanders, and Andrew A. Sosanya "Characterization of Redlen CZT detectors for hard x-ray astronomy", Proc. SPIE 10762, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX, 1076214 (13 September 2018); https://doi.org/10.1117/12.2321990

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