Subsurface Flaw Detection In Reflective Materials By Thermal-Transfer Imaging

X. Maldague; J. C. Krapez; P. Cielo

doi:10.1117/12.953399

21 March 1989 Subsurface Flaw Detection In Reflective Materials By Thermal-Transfer Imaging

X. Maldague, J. C. Krapez, P. Cielo

Proceedings Volume 1094, Thermosense XI: Intl Conf on Thermal Infrared Sensing for Diagnostics and Control; (1989) https://doi.org/10.1117/12.953399
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

A thermal-imaging apparatus is disclosed for the nondestructive detection of subsurface defects in materials which would not usually lend themselves to thermal imaging because of their low emissivity and high susceptibility to background reflection noise. This is accomplished by transferring the thermal image produced by surface temperature perturbation of the workpiece material to a high-emissivity material with which it is continuously brought in contact. The transferred thermal image may be observed by a suitable infrared device resulting in a high-radiance image with minimum reflectivity or variable emissivity noise. Numerical simulations, as well as experimental results, are presented.

Citation Download Citation

X. Maldague, J. C. Krapez, and P. Cielo "Subsurface Flaw Detection In Reflective Materials By Thermal-Transfer Imaging", Proc. SPIE 1094, Thermosense XI: Intl Conf on Thermal Infrared Sensing for Diagnostics and Control, (21 March 1989); https://doi.org/10.1117/12.953399

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