Paper
18 December 2018 Optical activity temperature-dependent measurements of chiral solutions using Mueller matrix spectroscopic ellipsometry
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Proceedings Volume 10976, 21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 109760A (2018) https://doi.org/10.1117/12.2519578
Event: 21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2018, Lednice, Czech Republic
Abstract
The optical activity measurements have been widely performed using a simple polarimeter with a monochromatic source so far. This work introduces versatile and simple technique of the optical activity measurements using Mueller matrix spectroscopic ellipsometer (Woollam RC2-DI) with the spectral range from 0.73 eV to 6.42 eV (wavelength range from 193 nm to 1700 nm). First, we present the measurements of chiral solutions under constant temperature, where the dependences of the optical activity on solution concentration were determined. The measured spectra were compared to a dispersion model and the specific rotatory powers were calculated. Second, temperature-dependent measurements were performed using homemade, specially designed temperature control cells with 1 °C accuracy. The calculated specific rotatory powers were compared to commonly tabulated data for the wavelength of 589 nm with a good agreement, which proves us repeatability and robustness of the proposed method.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Vala, Martin Mičica, Kamil Postava, and Jaromír Pištora "Optical activity temperature-dependent measurements of chiral solutions using Mueller matrix spectroscopic ellipsometry", Proc. SPIE 10976, 21st Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 109760A (18 December 2018); https://doi.org/10.1117/12.2519578
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Cited by 2 scholarly publications.
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KEYWORDS
Optical activity

Temperature metrology

Molecules

Spectroscopic ellipsometry

Chemical elements

Polarization

Spectroscopy

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