SERS for trace level detections (Conference Presentation)

Zhengjun Zhang

doi:10.1117/12.2518874

14 May 2019 SERS for trace level detections (Conference Presentation)

Zhengjun Zhang

Proceedings Volume 11028, Optical Sensors 2019; 110280T (2019) https://doi.org/10.1117/12.2518874
Event: SPIE Optics + Optoelectronics, 2019, Prague, Czech Republic

Abstract

Surface-enhanced Raman scattering (SERS) has been proven a powerful means in detecting molecules/chemicals at trace levels due to its huge enhancement in the signal intensity of the finger prints of the molecules. The SERS experiments were carried out using Ag nanorods deposited on silicon substrates homogeneously, by e-beam glancing angle deposition (GLAD) technique, with controlled morphology and size, guranteening the homogeneity of the SERS signals from area to area. However, these substrates are facing several problems due to the thermal stability, temporal stability and chemical stability, etc. of Ag nanostructures. We proposed several approaches to solve these problems to make Ag-based nanostructures applicable as SERS substrates. In addition, we proposed a method to quantify the composition of chemical mixtures at trace levels by SERS, based on the principle components analysis (PCA), which is a statistical method normally used to distinguish chemicals in mixtures. The method was evidenced to be effective in predicting the composition of binary, ternary mixtures and even mixtures consisting of more components at trace levels by SERS, with acceptable errors.

Conference Presentation

Citation Download Citation

Zhengjun Zhang "SERS for trace level detections (Conference Presentation)", Proc. SPIE 11028, Optical Sensors 2019, 110280T (14 May 2019); https://doi.org/10.1117/12.2518874

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KEYWORDS

Chemical analysis

Nanostructures

Silver

Molecules

Nanorods

Principal component analysis

Raman scattering

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