Paper
7 March 2019 Process optimization: internal feature measurement for additive-manufacturing parts using x-ray computed tomography
Dawei Xu, Fang Cheng, Yu Zhou, Thaddie Matalaray, Pei Xian Lim, Liping Zhao
Author Affiliations +
Proceedings Volume 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation; 110530H (2019) https://doi.org/10.1117/12.2511429
Event: 10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018), 2018, Kunming, China
Abstract
X-ray computed tomography (CT) is a non-destructive approach to verify internal features of various industrial components built by additive manufacturing (AM) or other processing methods. However, the measurement results was highly impacted by numerous factors. In this study, DoE (Design of Experiments) was conducted to statistically study impacts of error source of X-ray CT metrology; optimal settings were recommended for different internal geometrical features. Measurement comparison between X-ray CT and CMM (Coordinate Measuring Machine) is also provided in this paper to analyze the principle difference of these two measurement technology.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dawei Xu, Fang Cheng, Yu Zhou, Thaddie Matalaray, Pei Xian Lim, and Liping Zhao "Process optimization: internal feature measurement for additive-manufacturing parts using x-ray computed tomography", Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530H (7 March 2019); https://doi.org/10.1117/12.2511429
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KEYWORDS
Diffractive optical elements

X-rays

X-ray computed tomography

Surface roughness

Spatial resolution

3D metrology

Additive manufacturing

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