In EUV TOF MS, bright laser pulses from a compact 46.9-nm-wavelength laser [1] are focused into nanometer size spots to ablate craters a few nanometers deep on selected regions of the sample. Elemental and molecular ions in the laser-created plasma are extracted and identified by their mass-to-charge ratio (m/z) using a time-of-flight (TOF) mass spectrometer. Analysis of the spatially resolved mass spectra obtained as the sample is displaced with respect to the focused laser beam enables one to construct 3-D composition images with nanoscale resolution [2]. In this talk I will describe recent advances of extreme ultraviolet MSI that show its unique capabilities to identify low concentration of high Z elements into glass matrices, and to map isotopic ratios [3].
[1] S. Heinbuch et al, "Demonstration of a desk-top size high repetition rate soft x-ray laser," Opt. Express 13, 4050-4055 (2005).
[2] I. Kuznetsov et al, "Three dimensional nanoscale molecular imaging by extreme ultraviolet laser ablation mass spectrometry, " Nature Communications, Vol. 6, Article No. 6944(2015).
[3] T. Green, et al, “Characterization of extreme ultraviolet laser ablation mass spectrometry for actinide trace analysis and nanoscale isotopic imaging,” J. Analy. At. Spectrom. Vol. 32, 1092 (2017).
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