The PXM  scintillator image resolution analysis

Ming-Ying Hsu; Gung-Chian Yin; Chien-yu Lee; Bo-Yi Chen; Yen-Fa Liao; Cheng Liang Liao; Yu-Shan Huang

doi:10.1117/12.2530776

9 September 2019 The PXM scintillator image resolution analysis

Ming-Ying Hsu, Gung-Chian Yin, Chien-yu Lee, Bo-Yi Chen, Yen-Fa Liao, Cheng Liang Liao, Yu-Shan Huang

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 111120B (2019) https://doi.org/10.1117/12.2530776
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The PXM (Projection X-ray Microscope) end station was used to complete a preliminary test at the SPring-8 12B2 beamline. The x-ray through scintillator and knife-edge become visible-light image can get from the sensor. The knifeedge image has an edge shape, which can create the edge response line. The edge response line can be differentiated from the point response line. The point response line can then be transferred by Fourier transformation, and achieve MTF (Modulation Transfer Function). Here we apply Chebyshev polynomials to fit the edge response line and calculate the MTF. We used 20× and 50× objective lenses to generate the knife-edge images and calculate the MTF value. We found that the scintillator design resolution is 1 μm, and following the MTF calculation, the image resolutions are about 3 μm and 1.4 μm in the 20× and 50× objective lens, respectively.

Citation Download Citation

Ming-Ying Hsu, Gung-Chian Yin, Chien-yu Lee, Bo-Yi Chen, Yen-Fa Liao, Cheng Liang Liao, and Yu-Shan Huang "The PXM scintillator image resolution analysis", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120B (9 September 2019); https://doi.org/10.1117/12.2530776

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