The new x-ray laboratory: enabling access to structure, composition, and morphology through laboratory x-ray instrumentation (Conference Presentation)

Jeff Gelb; David Vine; Ruimin Qiao; Xiaolin Yang; Srivatsan Seshadri; Benjamin Stripe; Sylvia Lewis; S. H. Lau; Wenbing Yun

doi:10.1117/12.2528840

17 September 2019 The new x-ray laboratory: enabling access to structure, composition, and morphology through laboratory x-ray instrumentation (Conference Presentation)

Jeff Gelb, David Vine, Ruimin Qiao, Xiaolin Yang, Srivatsan Seshadri, Benjamin Stripe, Sylvia Lewis, S. H. Lau, Wenbing Yun

Author Affiliations +

Proceedings Volume 11113, Developments in X-Ray Tomography XII; 111130E (2019) https://doi.org/10.1117/12.2528840
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The past decade has witnessed tremendous growth in both interest and available techniques for laboratory X-ray analysis. From the progression of commercially-available micro- and nano-CT scanners to the resolution and sensitivity enhancements of x-ray fluorescence spectrometers, the scientific community is benefiting from a rapid expansion of laboratory-based x-ray techniques. In our work, we have developed a suite of advanced x-ray instrumentation providing a wide range of enhanced capabilities for specimen characterization. The key enabling technology lies in the X-ray source, which features a microstructured target capable of providing 5-10x higher brightness than conventional sealed-tube x-ray sources and offering power flux densities that rival rotating anode sources. The target array can be custom-designed to incorporate a variety of materials, facilitating fast & easy switching between characteristic emission lines and radiation spectra. This source has been subsequently integrated with state-of-the-art X-ray focusing optics, such as ellipsoidal/paraboloidal capillary lenses and finely-structured Fresnel zone plate imaging objective lenses, and sensitive scintillator-coupled CCD detection systems, opening up new opportunities for advancing laboratory x-ray inspection equipment. Here, we will describe the system geometries in detail and demonstrate how these new advancements have led us to the development of laboratory micro-XRF, nano-XRM, and XAS instrumentation. We will also briefly introduce the image-centric software workspace, which facilitates novice users to collect data quickly and reliably with minimal training overhead.

Conference Presentation

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Jeff Gelb, David Vine, Ruimin Qiao, Xiaolin Yang, Srivatsan Seshadri, Benjamin Stripe, Sylvia Lewis, S. H. Lau, and Wenbing Yun "The new x-ray laboratory: enabling access to structure, composition, and morphology through laboratory x-ray instrumentation (Conference Presentation)", Proc. SPIE 11113, Developments in X-Ray Tomography XII, 111130E (17 September 2019); https://doi.org/10.1117/12.2528840

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KEYWORDS

X-rays

Imaging systems

Lenses

X-ray fluorescence spectroscopy

X-ray imaging

X-ray optics

X-ray sources

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