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12 July 2019 Space validation of 1550nm DFB laser diode module
Philip Henderson, Adrian Norman, John MacDougall, Paul Naylor, Efstratios Kehayas, Lip Sun How, Sébastien Lhuillier, Alain Bensoussan, Mustapha Zahir
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Proceedings Volume 11180, International Conference on Space Optics — ICSO 2018; 111805G (2019) https://doi.org/10.1117/12.2536115
Event: International Conference on Space Optics - ICSO 2018, 2018, Chania, Greece
Abstract
Following a program funded by the European Space Agency, a novel laser-diode module has been created and tested to ESCC-23201-compliant space standards. Manufactured by Gooch & Housego, the module is set for imminent entry to the European space market for use in optical signal-processing and telecom systems. Emission is from a 1550nm DFB semiconductor laser diode driven at constant nominal current and temperature. Combined with a wavelength stability of better than ±0.1nm and internal data rate of up to 3.2GHz, innovative sub-design and packaging provides for a unique power capability comprising a start-of-life ex-fibre power of >90mW and a typical electric power consumption that, at <4.1W, is down to 25% of that of similar products. Validation testing by AdvEOTec (France) indicates a comprehensive set of space compliances such as in proton irradiation, humidity, hot/cold storage, rapid depressurisation, vibration and 1,000g shock, as well as immunity to ±8kV of ESD, 10-5mbar of vacuum, and 100krad of gamma irradiation. Unique methodologies for life-test modelling and production screening, established by Thales Alenia Space (France), provisionally confirm a 15-year space-compliant operating life. Space-compliant product, as presented, is intended to be supplied for a period of at least 5 years.
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Philip Henderson, Adrian Norman, John MacDougall, Paul Naylor, Efstratios Kehayas, Lip Sun How, Sébastien Lhuillier, Alain Bensoussan, and Mustapha Zahir "Space validation of 1550nm DFB laser diode module", Proc. SPIE 11180, International Conference on Space Optics — ICSO 2018, 111805G (12 July 2019); https://doi.org/10.1117/12.2536115
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KEYWORDS
Semiconductor lasers
Nano opto mechanical systems
Temperature metrology
Laser applications
Reliability
Manufacturing
Optics manufacturing
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