How can a plenoptic camera be used as a metrology tool?

Zewei Cai; Xiaoli Liu; Giancarlo Pedrini; Wolfgang Osten; Xiang Peng

doi:10.1117/12.2540184

18 November 2019 How can a plenoptic camera be used as a metrology tool?

Zewei Cai, Xiaoli Liu, Giancarlo Pedrini, Wolfgang Osten, Xiang Peng

Proceedings Volume 11189, Optical Metrology and Inspection for Industrial Applications VI; 1118902 (2019) https://doi.org/10.1117/12.2540184
Event: SPIE/COS Photonics Asia, 2019, Hangzhou, China

Abstract

In this paper, we propose a method for the structured-light field (SLF) 3D measurement, involving ray calibration and phase mapping. The ray calibration is carried out to determine each light ray with metric spatio-angular parameters. Base on the ray parametric equation, the phase mapping in the SLF is developed so that spatial coordinates could be directly mapped from phase-encoding information. Then, a calibration strategy is designed to determine the mapping coefficients for each light ray, achieving high-efficiency SLF 3D reconstruction.

Citation Download Citation

Zewei Cai, Xiaoli Liu, Giancarlo Pedrini, Wolfgang Osten, and Xiang Peng "How can a plenoptic camera be used as a metrology tool?", Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 1118902 (18 November 2019); https://doi.org/10.1117/12.2540184

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