Presentation + Paper
22 January 2020 Surface flattening of poly-Si thin films by laser annealing and electrical properties of LTPS-TFTs
Author Affiliations +
Abstract
Low-temperature poly-Si (LTPS) thin films formed by excimer laser annealing (ELA) are used as the channel material for thin film transistors (TFTs), which have an application as switching devices in flat panel displays. It is well known that one of the major problems in TFT manufacturing is the prominent ridges that form on LTPS thin films after ELA due to volume expansion by crystallization, which in turn induces gate leakage current in the TFTs. In this presentation, we report on the use of additional laser irradiation to reduce the height of the ridges and resulting changes in the electrical properties of LTPS-TFTs.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fuminobu Hamano, Akira Mizutani, Kaname Imokawa, Daisuke Nakamura, Tetsuya Goto, and Hiroshi Ikenoue "Surface flattening of poly-Si thin films by laser annealing and electrical properties of LTPS-TFTs", Proc. SPIE 11268, Laser-based Micro- and Nanoprocessing XIV, 1126810 (22 January 2020); https://doi.org/10.1117/12.2544910
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Thin films

Annealing

Crystals

Excimer lasers

Laser irradiation

Radium

Flat panel displays

Back to Top