Finite-Element Analysis Of Ion-Exchanged Channel Waveguides

Guy Lamouche; S. Iraj Najafi

doi:10.1117/12.961446

21 December 1989 Finite-Element Analysis Of Ion-Exchanged Channel Waveguides

Guy Lamouche, S. Iraj Najafi

Proceedings Volume 1128, Glasses for Optoelectronics; (1989) https://doi.org/10.1117/12.961446
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

Scalar finite-element method is used to analyze ion-exchanged channel waveguides. First, the accuracy of the calculation is tested by comparing the theoretical prediction and experimental measurement of cut-off wavelengths. Excellent agreement is observed. Then, this method is utilized to study the mode profile of ion-exchanged channel waveguides with a SiO2:TiO2 cover layer. It is shown that waveguides with circular mode profile can be achieved. Finally, the ion-exchanged waveguides with a grating are studied. the effect of grating parameters on waveguide behavior is investigated.

Citation Download Citation

Guy Lamouche and S. Iraj Najafi "Finite-Element Analysis Of Ion-Exchanged Channel Waveguides", Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); https://doi.org/10.1117/12.961446

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