Paper
28 September 1989 Simultaneous Amplitude Modulation Contrast (SAMC) A New Optical Imaging Technique
Burkhard Neumann
Author Affiliations +
Proceedings Volume 1139, Optical Storage and Scanning Technology; (1989) https://doi.org/10.1117/12.961781
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
A new kind of contrast for an optical microscope is presented. It can be realized by first imaging a rotating grating onto the object and then imaging the grating together with the object to a second rotating grating positioned in an intermediate image plane. The image of the first grating must be congruent with the second one and the rotating velocities of the two gratings have to be slightly different. Hence a beat frequency will occur in those areas where the contrast of the first grating is not diminished too much by the corresponding object fields. This kind of procedure may be called simultaneous heterodyne detection. The "carrier frequency" is presented by the first grating, which is modulated by the optical properties (reflection, transmission, de-fraction etc.) of the object. After mixing the "carrier wave" with the "reference wave" (presented by the second grating) the image intensity varies with the beat frequency which carries the image information. A video camera is synchronized with the beat frequency so that image pick up will take place only at the maximum and minimum of the image intensity. The difference of the two images will finally form the required image. It is proved within the validity of incoherent approximation that super-resolution is possible.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Burkhard Neumann "Simultaneous Amplitude Modulation Contrast (SAMC) A New Optical Imaging Technique", Proc. SPIE 1139, Optical Storage and Scanning Technology, (28 September 1989); https://doi.org/10.1117/12.961781
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KEYWORDS
Content addressable memory

Optical storage

Stars

Image processing

Modulation

Cameras

Critical dimension metrology

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