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A time-resolved soft X-ray emission spectrometer covering 250-620 eV is presented for the study of chemical reaction processes. Contrary to conventional time-resolved spectrometer, our spectrometer can obtain a two-dimensional timeenergy map in single shot by adding an imaging mirror to the flat-field spectrometer. The temporal changes are spatially encoded in the footprint of the probe X-ray beam on the sample via grazing incidence geometry. The flat-field spectrometer design is chosen to alleviate the aberration of the imaging mirror. The spectrometer is optimized at 400 eV, targeting at over 2000 resolving power and sub-picosecond time resolution.
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Xiaowei Yang, Jianwei Meng, Peng Liu, Xing Liu, Tsu-Chien Weng, "A soft x-ray emission flat-field grating spectrometer for time-resolved spectroscopy," Proc. SPIE 11617, International Conference on Optoelectronic and Microelectronic Technology and Application, 1161707 (4 December 2020); https://doi.org/10.1117/12.2584349