Presentation + Paper
5 March 2021 Three-dimensional localization precision for self-interference digital holography
Author Affiliations +
Abstract
Localization based microscopy using self-interference digital holography (SIDH) provides three-dimensional (3D) positional information about point sources with nanometer scale precision. To understand the performance limits of SIDH, we calculate the Cram´er-Rao lower bound (CRLB) of the localization precision for SIDH. We further compare the calculated precision bounds to the 3D single molecule localization precision from different Point Spread Functions. SIDH results in almost constant localization precision in all three dimensions for a 20 µm axial range. For high signal-to-background ratio (SBR), SIDH on average achieves better localization precision. For lower SBR values, the large size of the hologram on the detector results in more overall noise, and PSF models perform better.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abhijit Marar and Peter Kner "Three-dimensional localization precision for self-interference digital holography", Proc. SPIE 11650, Single Molecule Spectroscopy and Superresolution Imaging XIV, 116500P (5 March 2021); https://doi.org/10.1117/12.2583221
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KEYWORDS
Digital holography

3D image processing

Holograms

Microscopy

Spherical lenses

Digital imaging

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