Presentation
5 March 2021 Mass production of AlN substrates by high speed homoepitaxial growth
Yoshinao Kumagai, Nao Takekawa, Ken Goto, Toru Nagashima, Reo Yamamoto, Junji Kotani
Author Affiliations +
Abstract
The development of high-power and reliable deep-UV optical devices requires low dislocation density AlN substrates. In this study, thick AlN layers were homoepitaxially grown on PVT-AlN(0001) substrates by HVPE method at a growth rate above 100 μm/h. The grown layer showed low dislocation densities of less than 1E4 cm^-2 and a high deep-UV optical transparency. Recent expansions in both diameter of the substrate and size of the growth reactor have enabled mass-production of 2-inch-diameter HVPE-AlN substrates for deep-UV optical devices. This work was partially supported by Innovative Science and Technology Initiative for Security Grant Number JPJ004596, ATLA, Japan.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshinao Kumagai, Nao Takekawa, Ken Goto, Toru Nagashima, Reo Yamamoto, and Junji Kotani "Mass production of AlN substrates by high speed homoepitaxial growth", Proc. SPIE 11706, Light-Emitting Devices, Materials, and Applications XXV, 117060M (5 March 2021); https://doi.org/10.1117/12.2577987
Advertisement
Advertisement
KEYWORDS
Aluminum nitride

Deep ultraviolet

Transparency

Metals

Optical components

Reliability

Solid state electronics

RELATED CONTENT

Advances in in situ metrology during epitaxy of UV LEDs...
Proceedings of SPIE (January 01 1900)
Ultrathin GaN/AlN quantum wells for deep UV emitters
Proceedings of SPIE (January 01 1900)
Mechanical Design Aspects Of Optomechanical Engineering
Proceedings of SPIE (November 29 1979)
Reliability of AlGaN-based deep UV LEDs on sapphire
Proceedings of SPIE (February 22 2006)

Back to Top