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The development of high-power and reliable deep-UV optical devices requires low dislocation density AlN substrates. In this study, thick AlN layers were homoepitaxially grown on PVT-AlN(0001) substrates by HVPE method at a growth rate above 100 μm/h. The grown layer showed low dislocation densities of less than 1E4 cm^-2 and a high deep-UV optical transparency. Recent expansions in both diameter of the substrate and size of the growth reactor have enabled mass-production of 2-inch-diameter HVPE-AlN substrates for deep-UV optical devices. This work was partially supported by Innovative Science and Technology Initiative for Security Grant Number JPJ004596, ATLA, Japan.
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Yoshinao Kumagai, Nao Takekawa, Ken Goto, Toru Nagashima, Reo Yamamoto, Junji Kotani, "Mass production of AlN substrates by high speed homoepitaxial growth," Proc. SPIE 11706, Light-Emitting Devices, Materials, and Applications XXV, 117060M (5 March 2021); https://doi.org/10.1117/12.2577987