1Harvard-Smithsonian Ctr. for Astrophysics (United States) 2The Univ. of Iowa (United States) 3Massachusetts Institute of Technology (United States) 4Univ. of Maryland, Baltimore County (United States) 5The Pilot Group (United States) 6NASA Ames Research Ctr. (United States)
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Arcus is an innovative MIDEX-class photon-counting X-ray spectroscopy mission. Due to the nature of the sources that Arcus will focus on, observations can be many tens of kiloseconds (ks) long. The resulting spectral images are reconstructed on the ground to remove measured pointing and instrument deflection effects that take place over that time, achieving a higher resolution than would be possible without removing these effects. Arcus’s 12 m focal length grazing incidence optics are separated from the detectors by a 10.8 m long by Ø1.85 m, onorbit deployable boom. This paper describes an implementation of an internal aspect sensor that uses flight tested commercial off the shelf (COTS) components to measure linear deflection from one end of that boom to the other to achieve a better than 22 micron resolution (3σ) correction for that motion, meeting the required performance that Arcus needs to maintain its achieve its imaging resolution.
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Jacob Hohl, Peter N. Cheimets, Casey DeRoo, Edward Hertz, Moritz Gunther, Kristin Madsen, Jenna Samra, Alan Schier, Randall Smith, Stephen Walker, "Development for a metrology system for the Arcus MIDEX mission," Proc. SPIE 11821, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXII, 1182107 (24 August 2021); https://doi.org/10.1117/12.2594671