Measurement and inversion of Mueller matrix on metal surface

Zifei Zhang; Yanhui Li; Tianjiao Zhang; Pengfei Yang

doi:10.1117/12.2606324

1 November 2021 Measurement and inversion of Mueller matrix on metal surface

Zifei Zhang, Yanhui Li, Tianjiao Zhang, Pengfei Yang

Proceedings Volume 12057, Twelfth International Conference on Information Optics and Photonics; 1205736 (2021) https://doi.org/10.1117/12.2606324
Event: Twelfth International Conference on Information Optics and Photonics, 2021, Xi'an, China

Abstract

In order to obtain the Mueller matrix of metal target, a model for measuring the Mueller matrix of metal surface is proposed in this paper. The model consists of light source, polarizing system, detecting system and detector. The Mueller matrix of any reflection direction can be measured in the plane composed of incident direction and target normal. The polarization modulation of light is realized by double wave plate rotation method. The Mueller matrix of metal target is inversed by discrete Fourier transform. In this paper, copper and aluminum are measured. In order to reduce the influence of error on the measurement results, this paper adopts the least square method to process the data. By comparing the experimental results with the model calculation, the results show that this method is an effective method to measure the Mueller matrix of metal targets. At the end of the paper, the advantages and disadvantages of the experiment and suggestions for improvement are given.

Citation Download Citation

Zifei Zhang, Yanhui Li, Tianjiao Zhang, and Pengfei Yang "Measurement and inversion of Mueller matrix on metal surface", Proc. SPIE 12057, Twelfth International Conference on Information Optics and Photonics, 1205736 (1 November 2021); https://doi.org/10.1117/12.2606324

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