Analysis of the parts' roughness parameters of high-speed printing equipment by optical profilometry

T. Roik; A. Brovkyn; A. Dubolazov

doi:10.1117/12.2615584

20 December 2021 Analysis of the parts' roughness parameters of high-speed printing equipment by optical profilometry

T. Roik, A. Brovkyn, A. Dubolazov

Proceedings Volume 12126, Fifteenth International Conference on Correlation Optics; 1212617 (2021) https://doi.org/10.1117/12.2615584
Event: Fifteenth International Conference on Correlation Optics, 2021, Chernivtsi, Ukraine

Abstract

The article is devoted to research on determining the roughness parameters of antifriction composite parts based on tool steel R6M5K5 grinding waste for high-speed printing equipment by optical profilometry using an optical profilometer ProfilControl 7S. It is shown the granularity, the elbor wheel’s bond material and the modes of fine elbor grinding significantly affect the surface roughness parameter Ra. The roughness parameter Ra best values, which meet the high requirements for the surface quality of the antifriction parts for printing machines, provide elbor LO grinding wheels with a grain size of 14–28 μm on a bakelite-rubber bond and fine cutting modes. It is recommended to carry out the flat elbor grinding at a wheel speed of 22 m/s, longitudinal feed of 2 m/min, cross feed of 0.1 mm/double stroke and cutting depth of 2 μm. Studies have shown the use of high-precision profilometric equipment allows obtaining not only accurate data on the surface roughness, but also helps to regulate the technological modes of fine elbor (cubonite CBN) grinding of working surfaces to obtain high quality parameters. Using the most up-to-date optical profilometric analysis for studying the surface quality parameters allowed correctly choosing the modes of new composite antifriction parts' processing and also to provide reliable results.

Citation Download Citation

T. Roik, A. Brovkyn, and A. Dubolazov "Analysis of the parts' roughness parameters of high-speed printing equipment by optical profilometry", Proc. SPIE 12126, Fifteenth International Conference on Correlation Optics, 1212617 (20 December 2021); https://doi.org/10.1117/12.2615584

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available