A quad-slits interferometer for the transverse beam-profile measurement at HLS-II

SanShuang Jin; Yunkun Zhao; Baogen Sun; Jigang Wang; Tianyu Zhou; Fangfang Wu; Ping Lu; LeiLei Tang

doi:10.1117/12.2623956

27 March 2022 A quad-slits interferometer for the transverse beam-profile measurement at HLS-II

SanShuang Jin, Yunkun Zhao, Baogen Sun, Jigang Wang, Tianyu Zhou, Fangfang Wu, Ping Lu, LeiLei Tang

Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 1216940 (2022) https://doi.org/10.1117/12.2623956
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China

Abstract

A quad-slits interferometer using visible light is designed to measure the transverse beam-profile of Hefei Light SourceII (HLS-II). On the basis of the basic beam parameters of the B7 source point, the preliminary simulation results are obtained by using the Synchrotron Radiation Workshop (SRW) code. In addition, the core parameters of the quad-slits component in the interferometer are further optimized.

Citation Download Citation

SanShuang Jin, Yunkun Zhao, Baogen Sun, Jigang Wang, Tianyu Zhou, Fangfang Wu, Ping Lu, and LeiLei Tang "A quad-slits interferometer for the transverse beam-profile measurement at HLS-II", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 1216940 (27 March 2022); https://doi.org/10.1117/12.2623956

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