Design of detection system based on low frequency noise of IGBT

Zhaohua Zhang; Pengfei Kou; Xiaojuan Chen

doi:10.1117/12.2641364

4 August 2022 Design of detection system based on low frequency noise of IGBT

Zhaohua Zhang, Pengfei Kou, Xiaojuan Chen

Proceedings Volume 12306, Second International Conference on Digital Signal and Computer Communications (DSCC 2022); 1230615 (2022) https://doi.org/10.1117/12.2641364
Event: Second International Conference on Digital Signal and Computer Communications (DSCC 2022), 2022, Changchun, China

Abstract

Insulated Gate Bipolar Transistor (IGBT) is the most innovative power device, widely used in the field of wind power converters and aerospace control systems. Its reliability is directly related to the safe operation of the whole system. On the basis of studying the statistical and physical characteristics of the low-frequency noise of the IGBT, a low-frequency noise detection system is designed to realize the non-destructive detection of low-frequency noise of IGBT in this paper. Taking IGBT single-tube normal device and faulty device as detection objects, the low-frequency noise time series and spectrum of the two types of devices are detected and analyzed. The experimental results show that the detection system has good performance. It can accurately obtain the low-frequency noise data of IGBT devices and complete the function of spectrum analysis. Through the exploration and research of this topic, it will provide accurate and feasible methods and techniques for the detection of low-frequency noise of IGBT devices, and provide strong support for the reliability characterization and fault diagnosis of IGBT devices.

Citation Download Citation

Zhaohua Zhang, Pengfei Kou, and Xiaojuan Chen "Design of detection system based on low frequency noise of IGBT", Proc. SPIE 12306, Second International Conference on Digital Signal and Computer Communications (DSCC 2022), 1230615 (4 August 2022); https://doi.org/10.1117/12.2641364

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KEYWORDS

Field effect transistors

Transistors

Instrument modeling

Amplifiers

Power supplies

Reliability

Capacitance

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