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21 December 2022 Structured illumination using deep learning: with applications to high-speed 3D surface imaging
Chao Zuo
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Proceedings Volume 12319, Optical Metrology and Inspection for Industrial Applications IX; 123190P (2022) https://doi.org/10.1117/12.2643140
Event: SPIE/COS Photonics Asia, 2022, Online Only
Abstract
In this presentation, I will show how the combination of deep learning and optical measurement will bring new "vitality" to the "traditional" field of structured light 3D imaging. Compared to traditional methods, deep learning shows promising performance for applications in fringe analysis, phase unwrapping, subset correlation, and error compensation. As a result, with the aid of deep learning, we have developed a series of "single-frame" high-precision unambiguous structured light techniques for high-speed, high-precision, ultrafast 3D imaging. Finally, I will introduce our recent research on Bayesian deep learning, which promises to assess the reliability of the network by explicitly quantifying uncertainty, opening a new window for the wide acceptance of artificial intelligence in the field of optical metrology.
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Chao Zuo "Structured illumination using deep learning: with applications to high-speed 3D surface imaging", Proc. SPIE 12319, Optical Metrology and Inspection for Industrial Applications IX, 123190P (21 December 2022); https://doi.org/10.1117/12.2643140
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KEYWORDS
Stereoscopy
3D applications
3D image processing
Optical metrology
3D metrology
Structured light
Optical interferometry
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